Event Title

Thermal Characterization of Vertical Cavity Surface Emitting Lasers (VCSELs) by Wavelength Shift Measurements

Mentor 1

Maryam Farzaneh

Location

Union Wisconsin Room

Start Date

24-4-2015 10:30 AM

End Date

24-4-2015 11:45 AM

Description

Vertical Cavity Surface Emitting Lasers (VCSELs) are semiconductor laser diodes with a wide variety of applications in many areas such as fiber optic communication and laser printers. Many of the operational and optical properties of VCSELs, including gain, threshold current, polarization, and output power are affected by temperature. Therefore, it is necessary to gain an understanding of the thermal effects in VCSELs in order to improve the design of the laser and its thermal management. In this presentation, we discuss the dependence of the VCSEL’s change in temperature on the changes of its dissipated electrical power by measuring the shift in the laser’s wavelength. In this method, the peak wavelength of the VCSEL’s lasing spectrum is measured for different bias currents and temperatures. The experimental setup allows for the control of both the current and the temperature by using a power supply and a thermoelectric cooler, respectively. The wavelength measurements will be done using a spectrometer. The experimental results are expected to yield a measure of the average thermal resistance of the laser. These results will be a preliminary step towards a more in-depth characterization and analysis of the thermal effects in VCSELs. The future studies will be carried out by thermal profiling using thermoreflectance microscopy technique, from which valuable information about temperature distribution and thermal properties of VCSELs can be extracted.

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Apr 24th, 10:30 AM Apr 24th, 11:45 AM

Thermal Characterization of Vertical Cavity Surface Emitting Lasers (VCSELs) by Wavelength Shift Measurements

Union Wisconsin Room

Vertical Cavity Surface Emitting Lasers (VCSELs) are semiconductor laser diodes with a wide variety of applications in many areas such as fiber optic communication and laser printers. Many of the operational and optical properties of VCSELs, including gain, threshold current, polarization, and output power are affected by temperature. Therefore, it is necessary to gain an understanding of the thermal effects in VCSELs in order to improve the design of the laser and its thermal management. In this presentation, we discuss the dependence of the VCSEL’s change in temperature on the changes of its dissipated electrical power by measuring the shift in the laser’s wavelength. In this method, the peak wavelength of the VCSEL’s lasing spectrum is measured for different bias currents and temperatures. The experimental setup allows for the control of both the current and the temperature by using a power supply and a thermoelectric cooler, respectively. The wavelength measurements will be done using a spectrometer. The experimental results are expected to yield a measure of the average thermal resistance of the laser. These results will be a preliminary step towards a more in-depth characterization and analysis of the thermal effects in VCSELs. The future studies will be carried out by thermal profiling using thermoreflectance microscopy technique, from which valuable information about temperature distribution and thermal properties of VCSELs can be extracted.