Part of the Semiconductor and Optical Materials Commons

Works by Maysam Rezaee in Semiconductor and Optical Materials

2019

Quantitative peel test for thin films/layers based on a coupled parametric and statistical study, Maysam Rezaee, Li Chih Tsai, Muhammad Istiaque Haider, Armin Yazdi, Ehsan Sanatizadeh, Nathan P. Salowitz
Mechanical Engineering Faculty Articles

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