Event Title

Increasing Conductivity of ZnO Thin-films by way of Parameterization of Precursor Sol Composition and Processing

Presenter Information

Karl Flanagan-Morris

Mentor 1

Nidal Abu-Zahra

Location

Union Wisconsin Room

Start Date

27-4-2018 1:00 PM

Description

In this presentation, the parameterization of ZnO thin films will be investigated. These thin films serve a vital role as a protective layer from UV-radiation, oxidative and moisture degradation. The ever-increasing need for inexpensive materials to serve as a replacement of expensive films, such as Indium Tin Oxide (ITO), used on solar panels has been growing; with the objective of lower the cost of solar panels. The films in this study are subjected to numerous variations in precursor concentration and composition, as well as processing conditions, with the goal of increasing conductivity of the film and utilizing it as a viable replacement for ITO as an electrode and protective layer. The characterization and electrical properties will be determined via XRD, SEM-EDS, Confocal Microscopy, 4-point probe and UV-Vis Spectroscopy.

This document is currently not available here.

Share

COinS
 
Apr 27th, 1:00 PM

Increasing Conductivity of ZnO Thin-films by way of Parameterization of Precursor Sol Composition and Processing

Union Wisconsin Room

In this presentation, the parameterization of ZnO thin films will be investigated. These thin films serve a vital role as a protective layer from UV-radiation, oxidative and moisture degradation. The ever-increasing need for inexpensive materials to serve as a replacement of expensive films, such as Indium Tin Oxide (ITO), used on solar panels has been growing; with the objective of lower the cost of solar panels. The films in this study are subjected to numerous variations in precursor concentration and composition, as well as processing conditions, with the goal of increasing conductivity of the film and utilizing it as a viable replacement for ITO as an electrode and protective layer. The characterization and electrical properties will be determined via XRD, SEM-EDS, Confocal Microscopy, 4-point probe and UV-Vis Spectroscopy.