Thermal Characterization of Vertical Cavity Surface Emitting Lasers (VCSELs) by Wavelength Shift Measurements
Mentor 1
Maryam Farzaneh
Location
Union Wisconsin Room
Start Date
24-4-2015 10:30 AM
End Date
24-4-2015 11:45 AM
Description
Vertical Cavity Surface Emitting Lasers (VCSELs) are semiconductor laser diodes with a wide variety of applications in many areas such as fiber optic communication and laser printers. Many of the operational and optical properties of VCSELs, including gain, threshold current, polarization, and output power are affected by temperature. Therefore, it is necessary to gain an understanding of the thermal effects in VCSELs in order to improve the design of the laser and its thermal management. In this presentation, we discuss the dependence of the VCSEL’s change in temperature on the changes of its dissipated electrical power by measuring the shift in the laser’s wavelength. In this method, the peak wavelength of the VCSEL’s lasing spectrum is measured for different bias currents and temperatures. The experimental setup allows for the control of both the current and the temperature by using a power supply and a thermoelectric cooler, respectively. The wavelength measurements will be done using a spectrometer. The experimental results are expected to yield a measure of the average thermal resistance of the laser. These results will be a preliminary step towards a more in-depth characterization and analysis of the thermal effects in VCSELs. The future studies will be carried out by thermal profiling using thermoreflectance microscopy technique, from which valuable information about temperature distribution and thermal properties of VCSELs can be extracted.
Thermal Characterization of Vertical Cavity Surface Emitting Lasers (VCSELs) by Wavelength Shift Measurements
Union Wisconsin Room
Vertical Cavity Surface Emitting Lasers (VCSELs) are semiconductor laser diodes with a wide variety of applications in many areas such as fiber optic communication and laser printers. Many of the operational and optical properties of VCSELs, including gain, threshold current, polarization, and output power are affected by temperature. Therefore, it is necessary to gain an understanding of the thermal effects in VCSELs in order to improve the design of the laser and its thermal management. In this presentation, we discuss the dependence of the VCSEL’s change in temperature on the changes of its dissipated electrical power by measuring the shift in the laser’s wavelength. In this method, the peak wavelength of the VCSEL’s lasing spectrum is measured for different bias currents and temperatures. The experimental setup allows for the control of both the current and the temperature by using a power supply and a thermoelectric cooler, respectively. The wavelength measurements will be done using a spectrometer. The experimental results are expected to yield a measure of the average thermal resistance of the laser. These results will be a preliminary step towards a more in-depth characterization and analysis of the thermal effects in VCSELs. The future studies will be carried out by thermal profiling using thermoreflectance microscopy technique, from which valuable information about temperature distribution and thermal properties of VCSELs can be extracted.
