Thickness Measurement of Thin Films in Thermal Evaporation
Mentor 1
Jorg Woehl
Location
Union Wisconsin Room
Start Date
28-4-2017 1:30 PM
End Date
28-4-2017 4:00 PM
Description
Metal evaporation is an important technique in several areas of science. It is frequently used in biology to prepare samples for electron microscopy, and can also be used for a diverse array of processes such as silvering telescope mirrors or different micro fabrications. While it is important to be able to deposit a layer of metal onto a surface. It is also useful to be able to block off a part of the the substrate, allowing metal to be deposited into a smaller area. This masking can be used from the macro scale, down into the micrometer scale. While being able to control the locations of the deposited metal is important, it is also important to determine how thick a deposited layer is. This can be determined by using a quartz crystal vibrating at a known frequency. While this method of determining thickness is well known, we are interested in how precisely and accurately it measures thickness in our setup. The actual thickness measurements will be determined using Atomic Force Microscopy.These will be compared with the sensor readings and allow the sensor to be calibrated.
Thickness Measurement of Thin Films in Thermal Evaporation
Union Wisconsin Room
Metal evaporation is an important technique in several areas of science. It is frequently used in biology to prepare samples for electron microscopy, and can also be used for a diverse array of processes such as silvering telescope mirrors or different micro fabrications. While it is important to be able to deposit a layer of metal onto a surface. It is also useful to be able to block off a part of the the substrate, allowing metal to be deposited into a smaller area. This masking can be used from the macro scale, down into the micrometer scale. While being able to control the locations of the deposited metal is important, it is also important to determine how thick a deposited layer is. This can be determined by using a quartz crystal vibrating at a known frequency. While this method of determining thickness is well known, we are interested in how precisely and accurately it measures thickness in our setup. The actual thickness measurements will be determined using Atomic Force Microscopy.These will be compared with the sensor readings and allow the sensor to be calibrated.
